MINOLTA 분광측색계 CM-3700A

MINOLTA 분광측색계 CM-3700A

분광측색계 CM-3700A

 

Features

 

  • 반사 - ISO, CIE, ASTM, DIN 및 JIS 표준인 di;8°, de;8° 수광학계를 사용한 반사 특성 측정

  • 투과 - CIE, ASTM, DIN 및 JIS 표준인 d;0° 수광학계를 사용한 투과 특성 측정

  • Pulsed xenon arc lamp light source

  • 6인치 적분구 채용 - 우수한 광학 특성을 가진 BaSO4 코팅

  • Double-beam feedback system - 고정밀 측정을 위한 밝기 또는 분광 특성 변화 자동 감지 및 보상

  • Polychromatic unit - 짙고 어우운 컬러 측정시 고반복성 확보를 위한 고효율 Diffraction grating 사용

  • 시료 측정 및 광원 관측을 위한 광학계는 안정성 확보를 위해 aluminum alloy block에 장착됨

  • SCI 및 SCE 전환 사용 가능

  • 다양한 Target Mask 선택 사용 가능 - Φ25.4mm, Φ8mm 및 3X5mm(rectangular)

  • 형광컬러 시료 측정을 위한 다양한 UV setting - 종이나 펄프와 같이 증백제를 함유하는 시료의 측정을 위한 UV cut filter 조정 가능(1000 steps)

  • 시료의 크기에 제한 받지 않는 측면 개방형 투과 시료 측정 Chamber

Specifications

Model

Measuring geometry

Detector

Wavelength range

Wavelength pitch

Half bandwidth

Photometric range

Light source

Minimum Measurement interval

Illumination/
measurement areas

Repeatability

Inter-instrument agreement (LAV)

UV adjustment

Transmittance chamber

Interface

Power

Operation temperature/humidity range *1

Storage temperature/humidity range

Dimensions

Weight

CM-3700A

Reflectance: di:8°, de:8° (diffuse illumination/8° viewing angle);

SCI(specular component included)/SCE(specular component excluded) switchable;
Conforms to CIE No.15, ISO 7724/1, ASTM E 1164, DIN 5033 Teil 7 and JIS Z8722 condition c standard
Transmittance: di:0°, de:0° (diffuse illumination/0° viewing angle)
Conforms to CIE No.15, ASTM E 1164, DIN 5033 Teil 7 and JIS Z 8722 condition g standard

Silicon photodiode array with flat holographic grating

360 to 740nm

10nm

Approx. 14nm average

0 to 200% Resolution: 0.001%

Pulsed xenon arc lamp

3 sec.

Reflectance: Changeable between LAV, MAV, and SAV

LAV: Φ28mm illumination/Φ25.4mm measurement
MAV: Φ11mm illumination/Φ8mm measurement
SAV: 5x7mm illumination/3x5mm measurement
Transmittance: Φ25mm/Approx. Φ20mm

When white calibration plate is measured 30 times at 10-sec. intervals after white calibration has been performed:
Spectral reflectance: Standard deviation within 0.05%
Chromaticity: Standard deviation within ΔE*ab 0.005
When black tile (BCRA Series; reflectance: 1%) is measured 30 times at 10-second intervals after white calibration has been performed:
Spectral reflectance:
380 to 740nm: Standard deviation within 0.02%
360 and 370nm: Standard deviation within 0.04%
Chromaticity: Standard deviation within ΔE*ab 0.05

mean ΔE*ab 0.08(typical) based on 12 BCRA Series II color tiles.
Max ΔE*ab 0.3 (corresponds to approx. ΔE*cmc 0.2) for any of 12 BCRA Series II color tiles compared to values measured with KONICA MINOLTA master body.

Computer controlled; continuously variable

Maximum sample thickness: Approx. 50mm
Maximum sample length: Unlimited(no sides when transmittance chamber cover is open)
Sample holder(optional) for holding sheet samples or containers of liquid samples can be installed/removed

USB 1.1

AC 100V/120V/230V/ 50/60Hz (using included AC adapter)

13 to 33℃, relative humidity 80% or less(at 33℃) with no condensation

0 to 40℃, relative humidity 80% or less(at 35℃) with no condensation

271 x 274 x 500mm (10-11/16 x 10-3/4 x 19-11/16in.)

18kg (39.7lb.)

MINOLTA CM-3700A 카타로그