Spectroradiometer CS-2000/2000ASH2400
Features
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0.003cd/m^2(2%, 1 측정각) 수준의 초저휘도 영역에서도 정밀하게 휘도 및 색도 측정 가능
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분광 방식으로 100000:1 수준의 콘트라스트 측정 구현(Peak 휘도 300cd/m^2로 했을 경우)
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저휘도 영역에서의 반복성 개선 및 측정 소요시간 단축(측정 시간 : 약4초(Normal mode 4cd/m^2, Fast mode 0.5cd/m^2))
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장비 본체에 컬러 LCD 창을 장착하여 분광 분포 그래프 등 그래픽 데이터의 즉각 확인 가능
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알기 쉬운 키 배열로 누구나 간단하게 조작 가능
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용도에 맞춘 최적의 측정각 제공으로 폭넓은 측정에 대응(1, 0.2, 0.1; 최소 측정 지름 0.1mm(Close-up lens 장착시)
Specifications
Model
Wavelength range
Wavelength resolution
Display wavelength bandwidth
Wavelength precision
Spectral bandwidth
Measuring angle(selectable)
Measurement luminance range
(Illuminant A)
Minimum luminance display
Accuracy: Luminance
(Illuminanct A)*1
Accuracy: Chromaticity
(Illuminanct A)*1
Repeatability: Luminance(2)
Repeatability: Chromaticity(2σ)
Polarization error
Integration time
Measurement time
Color space mode
Interface
Operating temperature/humidity
Storage temperature/humidity
Size
Weight
CS-2000
380 to 780nm
0.9nm/pixel
1.0nm
±0.3 nm (median wavelength: 435.8nm, 546.1 nm, 643.8 nm Hg-Cd lamp)
5 nm or less (half bandwidth)
1°/0.2°/0.1°
1° : 0.003 to 5,000 cd/m2
0.2° : 0.075 to 125,000 cd/m2
0.1° : 0.3 to 500,000 cd/m2
0.00002 cd/m2
±2%
x,y :±0.003 (0.003 to 0.005 cd/m2)
x,y :±0.002 (0.005 to 0.05 cd/m2)
x :±0.0015 (0.05 cd/m2 to)
y :±0.001
0.4 % (0.003 to 0.05 cd/m2)
0.3 % (0.05 to 0.1 cd/m2)
0.15 % (0.1 to 5,000 cd/m2)
0.002 (0.003 to 0.005 cd/m2 )
0.001 (0.005 to 0.1 cd/m2)
0.0006 (0.1 to 0.2 cd/m2)
0.0004 (0.2 to 5,000 cd/m2)
1°:2% or less(400 to 780nm); 0.1° and 0.2°: 3% or less (400 to 780 nm)
Fast: 0.005 to 16 sec; Normal: 0.005 to 120 sec.
2 sec min. (Manual mode) to 243 sec. max. (Normal mode)
LVxy, Lvu'v', LvTuv, XYZ, dominant wavelength, spectral graph
USB 1.1
5 to 35℃, relative humidity 80% or less with no condensation
0 to 45℃, relative humidity 80% or less with no condensation
Main unit: 158 (W) 200 (H) 300 (D) mm; Lens: 70 95 mm
6.2 kg